{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:49:31Z","timestamp":1725572971532},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520501","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Solving the initial voltage of settling in switched-capacitor circuits"],"prefix":"10.1109","author":[{"given":"Jia","family":"Sun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timo","family":"Rahkonen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.891718"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2013761"},{"key":"ref6","first-page":"117","author":"sumanen","year":"2002","journal-title":"Pipeline Analog-to-Digital Converters for Wide-Band Wireless Communications"},{"key":"ref5","first-page":"198","article-title":"A 90 nm CMOS 0.28 mm 1V12b 40 MS\/s ADC with 0.39 pJ\/conversion-step","author":"lee","year":"2007","journal-title":"IEEE Symp VLSI Circuits Dig Tech Papers"},{"key":"ref8","article-title":"Using Analog Circuits to Motivate the Laplace Transform in Introductory Differential Equations","author":"savoye","year":"0","journal-title":"PASSJEMA annual conference"},{"journal-title":"Mathematical Modeling and Simulation","year":"2009","author":"velten","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.545805"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856289"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520501.pdf?arnumber=7520501","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T10:48:47Z","timestamp":1474886927000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520501\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520501","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}