{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:30:28Z","timestamp":1725705028209},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520510","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Detection of fault electrode in EIT for two-phase flow"],"prefix":"10.1109","author":[{"given":"Min-Ho","family":"Jeon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masahiro","family":"Takei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyung-Youn","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.flowmeasinst.2011.09.003"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1088\/0967-3334\/32\/7\/S04"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TGRS.2015.2391999"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TBME.2010.2052618"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1088\/0967-3334\/35\/9\/1813"},{"key":"ref8","first-page":"71","article-title":"Random sample consensus: A paradigm for model fitting applications to image analysis and automated cartography","author":"fishler","year":"1980","journal-title":"Proc Image Understanding Workshop"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1088\/0967-3334\/36\/6\/1227"},{"year":"2005","author":"holder","journal-title":"Electrical Impedance Tomography Methods History and Applications","key":"ref2"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TGRS.2015.2431434"},{"year":"1997","author":"vauhkonen","journal-title":"Electrical impedance tomography and prior information","key":"ref1"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520510.pdf?arnumber=7520510","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T14:48:50Z","timestamp":1474901330000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520510\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520510","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}