{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T09:05:05Z","timestamp":1725440705881},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520511","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Sparse electromagnetic tomography based on matching pursuit algorithms"],"prefix":"10.1109","author":[{"given":"Yang","family":"Tao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenbo","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yifei","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christos","family":"Ktistis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wuliang","family":"Yin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anthony J.","family":"Peyton","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611970791"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/7.4.308"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/1022003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2004.834793"},{"key":"ref14","first-page":"1","article-title":"Fast and robust reconstruction approach for sparse fluorescence tomography based on adaptive matching pursuit","author":"xue","year":"2011","journal-title":"Communications and Photonics Conference and Exhibition 2011 ACP Asia"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/15\/4\/301"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2040551"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7011-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0437847100"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/18.959265"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08900-3"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/22\/1\/316"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2030345"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511730344"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.900760"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2012.2224518"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2237072"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/28\/7\/S23"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.864420"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/78.558475"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.1993.342465"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/A:1018917218956"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2128866"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-008-9035-z"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520511.pdf?arnumber=7520511","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T10:48:51Z","timestamp":1474886931000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520511\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520511","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}