{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T06:11:26Z","timestamp":1759385486466,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520512","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-6","source":"Crossref","is-referenced-by-count":15,"title":["Application of twin-plane ECT sensor for identification of the internal imperfections inside concrete beams"],"prefix":"10.1109","author":[{"given":"Krzysztof","family":"Grudzien","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zbigniew","family":"Chaniecki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrzej","family":"Romanowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dominik","family":"Sankowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacek","family":"Nowakowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maciej","family":"Niedostatkiewicz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"108","article-title":"Multiphase Flow Measurement by Electrical Capacitance Tomography","author":"wq","year":"0","journal-title":"Imaging Systems and Techniques (IST) 2011 IEEE"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0032-5910(01)00516-2"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0955-5986(00)00023-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2009.12.006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2010.01.034"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2008.12.003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1108\/SR-06-2013-692"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.cemconres.2009.08.023"},{"key":"ref18","first-page":"175","article-title":"Multichannel capacitance tomograph for dynamic process imaging","volume":"11","author":"brzeski","year":"2003","journal-title":"Opto-Electronics Review"},{"key":"ref4","first-page":"295","volume":"14","author":"schabowicz","year":"2014","journal-title":"Ultrasonic tomography - The latest nondestructive technique for testing concrete members - Description test methodology application example Archives of Civil and Mechanical Engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2007.08.008"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cemconres.2010.08.015"},{"key":"ref5","first-page":"1353","article-title":"Application of the capacitance and X-ray measurement techniques for monitoring the structure of concrete beams","author":"niedostatkiewicz","year":"2010","journal-title":"Proc of the 6th World Congress on Industrial Process Tomography (WCIPT-6)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1201\/9781420028195"},{"key":"ref7","first-page":"308","author":"sankowski","year":"2010","journal-title":"Electrical Capacitance Tomography Theoretical Basis and Applications"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(00)00012-8"},{"key":"ref1","article-title":"Ultrasonic and X-ray tomographic imaging of highly contrasting inclusions in concrete specimens","author":"daigle","year":"2003","journal-title":"GeoFrontier Conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2014.05.006"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520512.pdf?arnumber=7520512","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T10:48:51Z","timestamp":1474886931000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520512\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520512","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}