{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T15:16:00Z","timestamp":1742397360430,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520527","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-5","source":"Crossref","is-referenced-by-count":10,"title":["Analysis of precision Rogowski coil via analytical method and effective cross section parameter"],"prefix":"10.1109","author":[{"given":"Mirko","family":"Marracci","sequence":"first","affiliation":[]},{"given":"Bernardo","family":"Tellini","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"9\/19\/10","article-title":"Geometrical properties of Rogowski sensors","author":"murgatroyd","year":"1994","journal-title":"Proc IEEE Colloq Low Freq Power Meas Anal Conf"},{"key":"ref3","first-page":"122128","article-title":"Mutual inductance of a precise Rogowski coil in dependence of the position of primary conductor","volume":"58","author":"ferkovi?","year":"2009","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref6","first-page":"887","article-title":"FEM Analysis of Rogowski coils coupled with bar conductors","author":"marracci","year":"2009","journal-title":"proc of IMEKO"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"223","DOI":"10.1049\/ip-epa:20020256","article-title":"voltage profiles and closures on rogowski coils","volume":"149","author":"viana","year":"2002","journal-title":"Electric Power Applications IEE Proceedings-"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIM.2010.2051591"},{"year":"1973","author":"grover","journal-title":"Inductance Calculations Working Formulas and Tables","key":"ref1"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520527.pdf?arnumber=7520527","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T19:20:54Z","timestamp":1498332054000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520527\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520527","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}