{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T11:09:53Z","timestamp":1759057793469},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520551","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Impedance based nanocrystalline silicon oxide immunosensor electronic tongue for ultrasensitive and low cost multiple food toxin detection"],"prefix":"10.1109","author":[{"given":"H.","family":"Ghosh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Das","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"RoyChaudhuri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.09.077"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2455535"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115410"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2415113"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2014.11.695"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2010.04.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2087746"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/ac034694g"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2012.10.133"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1315485111"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2015.01.046"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2008.11.010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2014.01.045"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2012.6411191"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.4811409"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2012.12.022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00216-009-2857-y"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2013.05.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2014.09.035"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/nl1020975"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520551.pdf?arnumber=7520551","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,25]],"date-time":"2016-09-25T23:38:51Z","timestamp":1474846731000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520551\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520551","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}