{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:25:44Z","timestamp":1725463544929},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520583","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Detection of the crack by reducing the influence of the magnetic domain based on the MOI"],"prefix":"10.1109","author":[{"given":"Lulu","family":"Tian","sequence":"first","affiliation":[]},{"given":"Yuhua","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Chun","family":"Yin","sequence":"additional","affiliation":[]},{"given":"Yongzhao","family":"Xia","sequence":"additional","affiliation":[]},{"given":"Yiyun","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Libing","family":"Bai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1117\/12.2014858"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.ndteint.2008.10.005"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.ndteint.2009.12.002"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.ndteint.2009.12.002"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.automatica.2014.10.027"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1103\/PhysRevLett.15.190"},{"year":"2003","author":"decitre","journal-title":"Modeling and Realization of a Quantitative Magneto-Optic Imager for the Characterization of Defects in Light Alloy Aeronautic Structures[D]","key":"ref16"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1364\/AO.23.000633"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1080\/14786436308212484"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/978-94-007-0723-8_4"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.ndteint.2012.08.007"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.physb.2011.12.040"},{"year":"2013","journal-title":"Electromagnetic Nondestructive Evaluation","key":"ref5"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TMAG.2006.878419"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TR.2012.2221613"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.conbuildmat.2011.12.103"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/I2MTC.2015.7151379"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TIM.2012.2220039"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520583.pdf?arnumber=7520583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,25]],"date-time":"2016-09-25T23:39:12Z","timestamp":1474846752000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520583","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}