{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:04:11Z","timestamp":1729674251422,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520596","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Measurement of ground-level charge density under a HVDC conductor with presence of fine particles"],"prefix":"10.1109","author":[{"given":"Zhilong","family":"Zou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Ju","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiang","family":"Cui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tiebing","family":"Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2476503"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2252203"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2258818"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0048-9697(02)00043-8"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/9781118001684"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2014.0333"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2172003"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.338105"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2015.0068"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2015.08.029"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.816460"},{"key":"ref2","first-page":"823","author":"rashid","year":"2011","journal-title":"Power Electronics Handbook Device Circuits and Applications"},{"key":"ref1","first-page":"92","author":"maruvada","year":"2011","journal-title":"Corona in Transmission Systems Theory Design and Performance"},{"key":"ref9","first-page":"3443","article-title":"Effects of space charges on the measurement accuracy of rotating direct current electric field mill","volume":"35","author":"zou","year":"2015","journal-title":"Proc Chinese Soc Elect Eng"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520596.pdf?arnumber=7520596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,25]],"date-time":"2016-09-25T23:39:16Z","timestamp":1474846756000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520596","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}