{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:13:48Z","timestamp":1729620828928,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969652","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:56:05Z","timestamp":1499709365000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["A novel nanocrystalline-based current transformer working on saturated region"],"prefix":"10.1109","author":[{"given":"Cleonilson","family":"Protasio de Souza","sequence":"first","affiliation":[]},{"given":"Jailton","family":"Ferreira Moreira","sequence":"additional","affiliation":[]},{"given":"Yuri P.","family":"Molina Rodriguez","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/I2MTC.2016.7520482"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/IMTC.2011.5944192"},{"key":"ref6","first-page":"840","article-title":"Inductive current sensor based on nanocrystalline alloys","author":"macedo","year":"2009","journal-title":"XIX IMEKO World Congress Fundamental and Applied Metrology"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"51","DOI":"10.4028\/www.scientific.net\/JMNM.1.51","article-title":"Magnetic properties and microstructure of nanocrystalline fe-based alloys","volume":"1","author":"yoshizawa","year":"1999","journal-title":"Advances in Nanocrystallization ser Journal of Metastable and Nanocrystalline Materials"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/87.930967"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TMAG.2015.2449836"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Torino, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969652.pdf?arnumber=7969652","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,29]],"date-time":"2019-09-29T06:38:09Z","timestamp":1569739089000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969652\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969652","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}