{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:20:18Z","timestamp":1766269218099},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969696","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T21:56:05Z","timestamp":1499723765000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["A method of spatially adaptive Lp regularization for electrical tomography"],"prefix":"10.1109","author":[{"given":"Zheng","family":"Wang","sequence":"first","affiliation":[]},{"given":"Yanbin","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Yang","family":"Pei","sequence":"additional","affiliation":[]},{"given":"Feng","family":"Dong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2013.07.010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/25\/12\/125402"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.909319"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898718836"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4760253"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/nme.3247"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/28\/12\/123001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/34\/9\/1027"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/1521-4117(200010)17:3<96::AID-PPSC96>3.0.CO;2-8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.20042"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Torino, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969696.pdf?arnumber=7969696","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,7,21]],"date-time":"2017-07-21T05:20:14Z","timestamp":1500614414000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969696\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969696","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}