{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:03:39Z","timestamp":1756771419451,"version":"3.44.0"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969703","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:56:05Z","timestamp":1499709365000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A feedback-based construction of multilayer measurement matrix for compressive sensing"],"prefix":"10.1109","author":[{"given":"Tianyou","family":"Zheng","sequence":"first","affiliation":[{"name":"Dept. of Control Science and Engineering, Harbin Institute of Technology, Harbin, China, 150001"}]},{"given":"Qiang","family":"Wang","sequence":"additional","affiliation":[{"name":"Dept. of Control Science and Engineering, Harbin Institute of Technology, Harbin, China, 150001"}]},{"given":"Yue","family":"Shen","sequence":"additional","affiliation":[{"name":"Dept. of Control Science and Engineering, Harbin Institute of Technology, Harbin, China, 150001"}]},{"given":"Yi","family":"Shen","sequence":"additional","affiliation":[{"name":"Dept. of Control Science and Engineering, Harbin Institute of Technology, Harbin, China, 150001"}]},{"given":"Xiaotian","family":"Lin","sequence":"additional","affiliation":[{"name":"Dept. of Control Science and Engineering, Harbin Institute of Technology, Harbin, China, 150001"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.911494"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2161982"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.862083"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2457391"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"1844","DOI":"10.1109\/LSP.2015.2438066","article-title":"Generalized nested sampling for conpressing low rank toeplitz matrices","volume":"22","author":"qiao","year":"2015","journal-title":"IEEE Signal Processing Letters"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2014.2347964"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.880031"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2013.2274267"},{"key":"ref3","first-page":"55","article-title":"comparing measures of sparsity","volume":"55","author":"richard","year":"2008","journal-title":"IEEE Transactions on Information Theory"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2007.909108"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2005.05.029"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2009.2016006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0020-0190(94)90048-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"ref1","first-page":"1433c1452","article-title":"Compressive sampling","volume":"3","author":"candes","year":"2006","journal-title":"Proceedings of the International Congress of Mathematicians"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"2197","DOI":"10.1073\/pnas.0437847100","article-title":"Optimally sparse representation in general(non-orthogonal) dictionaries vial1 minimization","volume":"100","author":"donoho","year":"2002","journal-title":"Proc Nat Acad Sci"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Turin, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969703.pdf?arnumber=7969703","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:14:30Z","timestamp":1756754070000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7969703\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969703","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}