{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,17]],"date-time":"2026-09-17T18:51:18Z","timestamp":1789671078938,"version":"4.0.1"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969796","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:56:05Z","timestamp":1499709365000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["Quantitative determination of small dielectric and loss tangent contrasts in liquids"],"prefix":"10.1109","author":[{"given":"Hind","family":"Bakli","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kamel","family":"Haddadi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2013.6555703"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2296416"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2533608"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1982.6312533"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(94)81013-6"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1987.1133782"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"2322","DOI":"10.1109\/TMTT.2008.2003520","article-title":"Design and calibration of a large open-ended coaxial probe for the measurement of the dielectric properties of concrete","volume":"56","author":"filali","year":"2008","journal-title":"IEEE Trans Microw Theory Tech"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2128510"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.847111"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520546"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236791"},{"key":"ref8","year":"0","journal-title":"Agilent 85070E dielectric probe kit 200 MHz to 50 GHz"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/bem.20271"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2528\/PIERC12050704"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2317295"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2012.2218230"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Torino, Italy","start":{"date-parts":[[2017,5,22]]},"end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969796.pdf?arnumber=7969796","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,29]],"date-time":"2019-09-29T06:37:41Z","timestamp":1569739061000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969796\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969796","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}