{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:15:58Z","timestamp":1730225758893,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969798","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T21:56:05Z","timestamp":1499723765000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["An absolute angle recovery method for dual-interferometer-based rotational stages"],"prefix":"10.1109","author":[{"given":"Pablo Serrano","family":"Galvez","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Butcher","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Masi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2007.04.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2007.07.060"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4795549"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/OL.31.003101"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2009.94"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/1464-4258\/4\/6\/381"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4831800"},{"key":"ref17","first-page":"104","article-title":"(VIM) International vocabulary of metrology Basic and general concepts and associated terms","volume":"3","year":"2012","journal-title":"International Vocabulary of Metrology (VIM)"},{"key":"ref4","first-page":"1630","article-title":"Interferometric measurement of angles","volume":"9","author":"harris","year":"1970","journal-title":"Measurement"},{"journal-title":"Nanopositioning Technologies Fundamentals and Applications","year":"2015","author":"ru","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.357124"},{"key":"ref5","first-page":"1978","volume":"1","author":"driscoll","year":"1978","journal-title":"Handbook of Optics"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/9\/10\/001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2012.10.016"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2015.7392706"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2007.4282300"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/10\/12\/317"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Torino, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969798.pdf?arnumber=7969798","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,7,24]],"date-time":"2017-07-24T19:42:24Z","timestamp":1500925344000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969798\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969798","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}