{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:48:52Z","timestamp":1729666132574,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969877","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:56:05Z","timestamp":1499709365000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Low-frequency spectral estimation (f<1 Hz) employing PC soundcards"],"prefix":"10.1109","author":[{"given":"G.","family":"Scandurra","sequence":"first","affiliation":[]},{"given":"G.","family":"Giusi","sequence":"additional","affiliation":[]},{"given":"G.","family":"Cannata","sequence":"additional","affiliation":[]},{"given":"C.","family":"Ciofi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","DOI":"10.1142\/S0219477513500077","article-title":"Estimation errors in 1\/fY noise spectra when employing DFT spectrum analyzers","volume":"12","author":"giusi","year":"2013","journal-title":"Fluct Noise Lett"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236719"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151606"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/33\/21\/201"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2405852"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1108\/SR-12-2014-0747"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2400422"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1063\/1.3258197","article-title":"An ultra low noise preamplifier for low frequency noise measurements","volume":"80","author":"cannat\u00e0","year":"2009","journal-title":"Rev Sci Instr"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1142\/S0219477504001963"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(95)93070-Q"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/16.333839"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.3605716"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Torino, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969877.pdf?arnumber=7969877","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,29]],"date-time":"2019-09-29T06:38:15Z","timestamp":1569739095000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969877\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969877","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}