{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:06:57Z","timestamp":1729616817577,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969915","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T21:56:05Z","timestamp":1499723765000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Fault detection in Class-E<sup>2<\/sup>resonant converters"],"prefix":"10.1109","author":[{"given":"M.","family":"Catelani","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Ciani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Corti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Luchetta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Manetti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. C.","family":"Piccirilli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Grasso","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Reatti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Agasthya","family":"Ayachit","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marian K.","family":"Kazimierczuk","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"4978","DOI":"10.1109\/TPEL.2013.2283881","article-title":"Fault diagnosis of PWM dc-dc converters based on magnetic component voltages","volume":"29","author":"nie","year":"2015","journal-title":"IEEE Trans Power Electron"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2252958"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2011.0163"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2310201"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2283881"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"1491","DOI":"10.1109\/TIE.2007.910627","article-title":"Fault diagnosis of a zvs dc&#x2013;dc converter based on dc-link current pulse shapes","volume":"55","author":"kim","year":"2008","journal-title":"IEEE Trans Ind Electron"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.911845"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"7569","DOI":"10.1109\/TIE.2015.2455523","article-title":"A fault-tolerant single-phase five-level inverter for grid-independent PV systems","volume":"62","author":"rao","year":"2015","journal-title":"IEEE Trans Ind Electron"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1023","DOI":"10.1049\/iet-pel.2010.0342","article-title":"Fault-tolerant sc-dc-ac single-phase to three-phase converter","volume":"4","author":"dos","year":"2011","journal-title":"IET Power Electronics"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.830074"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"7569","DOI":"10.1109\/TIE.2015.2455523","article-title":"A fault-tolerant single-phase five-level inverter for grid-independent PV systems","volume":"62","author":"rao","year":"2015","journal-title":"IEEE Trans Ind Electron"},{"key":"ref3","first-page":"402","article-title":"Towards realiable power electronics: Challenges, design tools, and opportunities","volume":"23","author":"wang","year":"2008","journal-title":"IEEE Ind modular DC-DC converters &#x201D; IEEE Trans Power Electron"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.830074"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1023","DOI":"10.1049\/iet-pel.2010.0342","article-title":"Fault-tolerant sc-dc-ac single-phase to three-phase converter","volume":"4","author":"dos","year":"2011","journal-title":"IET Power Electronics"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2252958"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2342878"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2016.7793285"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2011.0163"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2342878"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594413"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168612"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010838"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/RTSI.2016.7740639"},{"key":"ref23","first-page":"95","article-title":"Symbolic analysis of PWM DC-DC converters operated under both continuous and discontinuous conduction modes","author":"grasso","year":"2008","journal-title":"Porceedings of SM2ACD 2008 &#x2013; 10th International Workshop on Symbolic and Numerical Methods Modeling and Applications to Circuit Design"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/EEEIC.2016.7555877"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Torino, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969915.pdf?arnumber=7969915","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,29]],"date-time":"2019-09-29T10:37:37Z","timestamp":1569753457000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969915\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969915","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}