{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T05:59:53Z","timestamp":1759384793748,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/i2mtc.2017.7969949","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T21:56:05Z","timestamp":1499723765000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Experimental performance assessment of compressive sampling-based THz imaging systems"],"prefix":"10.1109","author":[{"given":"Leopoldo","family":"Angrisani","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"Bonavolonta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giovanni","family":"Cavallo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Annalisa","family":"Liccardo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rosario Schiano Lo","family":"Moriello","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonello","family":"Andreone","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gianpaolo","family":"Papari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914730"},{"key":"ref11","article-title":"Terahertz characterization of electronic components and comparison of terahertz imaging with x-ray imaging techniques","author":"ahi","year":"2015","journal-title":"Proc Int Soc Opt Eng"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/23\/3\/008"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.20124"},{"key":"ref15","article-title":"Comparison of Image Quality Assessment: PSNR, HVS, SSIM, UIQI","volume":"3","author":"al-najjar","year":"2012","journal-title":"International Journal of Scientific & Engineering Research"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"article-title":"Learning to Generate Images with Perceptual Similarity Metrics","year":"2016","author":"ridgeway","key":"ref17"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2011.2159553"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156403001776"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MetroAeroSpace.2014.6865974"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2003.1321"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1117\/12.886998"},{"key":"ref7","article-title":"Advanced terahertz techniques for quality control and counterfeit detection","author":"ahi","year":"2016","journal-title":"Proc Of Proc SPIE 9856 Terahertz Physics Devices and Systems X Advanced Applications in Industry and Defense"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-012-9949-z"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2007.10.049"},{"key":"ref9","article-title":"A single pixel imaging system based on compressive sensing","volume":"93","author":"chan","year":"2008","journal-title":"Physics Letters"}],"event":{"name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2017,5,22]]},"location":"Torino, Italy","end":{"date-parts":[[2017,5,25]]}},"container-title":["2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959776\/7969646\/07969949.pdf?arnumber=7969949","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,7,21]],"date-time":"2017-07-21T05:39:09Z","timestamp":1500615549000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7969949\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2017.7969949","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}