{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T19:17:53Z","timestamp":1725736673525},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409548","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T19:02:41Z","timestamp":1532977361000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Server power supply test automation approach"],"prefix":"10.1109","author":[{"given":"Elpiniki","family":"Apostolaki-Iosifidou","sequence":"first","affiliation":[]},{"given":"Narayanan","family":"Ramachandran","sequence":"additional","affiliation":[]},{"given":"Lam","family":"Dong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"How to Automate Measurements with Python Electronics EETimes","year":"2016","author":"guerrieri","key":"ref10"},{"journal-title":"How We Test Power Supply Units - Tom's Hardware Tom's Hardware","year":"2015","author":"mpitziopoulos","key":"ref11"},{"journal-title":"GW Instek model APS-1102A Features","year":"2015","author":"instek","key":"ref12"},{"journal-title":"Wikipedia Standard Commands for Programmable Instruments","year":"2016","key":"ref13"},{"journal-title":"GW Instek PEL-2000 Series Features","year":"2015","author":"instek","key":"ref14"},{"journal-title":"Tektronix MDO3000 Series Mixed Domain Oscilloscopes User Manual 2004","year":"2016","key":"ref15"},{"journal-title":"National Instruments NI-VISA","year":"2016","key":"ref16"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/INTLEC.1979.4793601"},{"key":"ref3","first-page":"3","article-title":"Power supply technology-past, present and future","author":"jovanovic","year":"2007","journal-title":"Power Conversion and Intelligent Motion Conference PCIM"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.1996.551200"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/INTLEC.1995.498941"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SIITME.2009.5407348"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2000.848853"},{"key":"ref2","article-title":"emphNVIDIA's GeForce GTX 480 and GTX 470: 6 Months Late, Was It Worth the Wait?, figure","author":"smith","year":"2010","journal-title":"Load Power Consumption - Crysis"},{"journal-title":"NVIDIA emphGPU-Based Deep Learning Inference A Performance and Power Analysis","year":"2015","key":"ref1"},{"journal-title":"National Instruments Buy LabView","year":"2016","key":"ref9"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409548.pdf?arnumber=8409548","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T19:32:50Z","timestamp":1534534370000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409548\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409548","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}