{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,9]],"date-time":"2026-02-09T16:37:18Z","timestamp":1770655038995,"version":"3.49.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409594","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T15:02:41Z","timestamp":1532962961000},"page":"1-5","source":"Crossref","is-referenced-by-count":14,"title":["Iris biometrics using deep convolutional networks"],"prefix":"10.1109","author":[{"given":"Hrishikesh","family":"Menon","sequence":"first","affiliation":[]},{"given":"Anirban","family":"Mukherjee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2016.7532769"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2017.134"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.411"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/EUSIPCO.2017.8081595"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SPMB.2016.7846859"},{"key":"ref15","first-page":"770","article-title":"Deep Residual Learning for Image Recognition","author":"he","year":"2016","journal-title":"Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2009.66"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2037996"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1111\/j.1600-0749.2004.00197.x"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1111\/j.1600-0749.2006.00345.x"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2015.2500196"},{"key":"ref3","article-title":"Stroke Point Warping-Based Reference Selection and Verification of Online Signature","author":"kar","year":"2017","journal-title":"accepted in IEEE Trans Instrumentation and Measurement"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2009.08.016"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"801","DOI":"10.1109\/ICPR.2000.906197","article-title":"Biometric Personal Identification based on Iris Patterns","volume":"2","author":"zhu","year":"2000","journal-title":"Pattern Recognition 2000 Proceedings 15th International Conference on"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.34"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/34.244676"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2037873"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-016-2325-5"},{"key":"ref1","author":"abraham","year":"2017","journal-title":"State of aadhaar report 2016–17"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2015.116"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-6784-6_20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2013.06.003"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DSP-SPE.2015.7369524"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2011.04.002"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICB.2012.6199824"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Houston, TX","start":{"date-parts":[[2018,5,14]]},"end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409594.pdf?arnumber=8409594","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T15:32:16Z","timestamp":1534519936000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409594\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409594","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}