{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:17:37Z","timestamp":1730225857439,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409649","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T15:02:41Z","timestamp":1532962961000},"page":"1-5","source":"Crossref","is-referenced-by-count":3,"title":["Prior based state reduction in backprojection type imaging algorithms for electrical tomography"],"prefix":"10.1109","author":[{"given":"M.","family":"Neumayer","sequence":"first","affiliation":[]},{"given":"M.","family":"Flatscher","sequence":"additional","affiliation":[]},{"given":"T.","family":"Bretterklieber","sequence":"additional","affiliation":[]},{"given":"S.","family":"Puttinger","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"337","article-title":"New Developments and Applications in Sensing Technology","volume":"83","author":"neumayer","year":"2011","journal-title":"Lecture Notes Electrical Engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/8\/317"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1108\/SR-01-2016-0027"},{"key":"ref5","volume":"160","author":"kaipio","year":"2005","journal-title":"Statistical and Computational Inverse Problems Ser Applied Mathematical Sciences"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/20\/5\/052002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1108\/COMPEL-02-2017-0090"},{"key":"ref2","article-title":"Process Imaging For Automatic Control (Electrical and Computer Enginee)","author":"scott","year":"2005","journal-title":"Boca Raton"},{"key":"ref9","article-title":"Non iterative reconstruction for electrical tomography using optimal first and second order approximations","author":"zangl","year":"0","journal-title":"World Congress on Industrial Process Tomography WCIPT 5 2007"},{"journal-title":"Electrical Impedance Tomography Methods History and Applications","year":"2005","author":"holder","key":"ref1"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409649.pdf?arnumber=8409649","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T15:31:37Z","timestamp":1534519897000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409649\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409649","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}