{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:51:31Z","timestamp":1725519091342},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409659","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T15:02:41Z","timestamp":1532962961000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Generating low-distortion ternary signals using an imperfect DAC and ADC chain"],"prefix":"10.1109","author":[{"given":"Alessio","family":"De Angelis","sequence":"first","affiliation":[]},{"given":"Paolo","family":"Carbone","sequence":"additional","affiliation":[]},{"given":"Johan","family":"Schoukens","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(99)00033-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.963198"},{"journal-title":"Analog-Digital Conversion Handbook","year":"1986","author":"sheingold","key":"ref12"},{"journal-title":"Digilent Analog Discovery 2 Reference Manual","year":"0","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.834079"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/9781118287422"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469548"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.83"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2622778"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2769238"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.772218"},{"journal-title":"IEEE Std 1241–2010 (Revision of IEEE Std 1241–2000)","article-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2011","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2771962"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409659.pdf?arnumber=8409659","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T15:32:23Z","timestamp":1534519943000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409659\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409659","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}