{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:07:48Z","timestamp":1725401268392},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409716","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T19:02:41Z","timestamp":1532977361000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Eddy current testing of cracks using multi-frequency and noise excitation"],"prefix":"10.1109","author":[{"given":"Dario J.","family":"Pasadas","sequence":"first","affiliation":[]},{"given":"Artur L.","family":"Ribeiro","sequence":"additional","affiliation":[]},{"given":"Helena. G.","family":"Ramos","sequence":"additional","affiliation":[]},{"given":"Bo","family":"Feng","sequence":"additional","affiliation":[]},{"given":"Prashanth","family":"Baskaran","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2292326"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.06.009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2232471"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.10.010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2507738"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1085837"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.02.004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2160553"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2682758"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2341653"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EuCAP.2016.7481447"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.12.015"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.11.005"},{"journal-title":"Practical Eddy Current Testing","year":"2007","author":"rao","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2016.02.009"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC )","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX, USA","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409716.pdf?arnumber=8409716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,7,31]],"date-time":"2018-07-31T08:00:35Z","timestamp":1533024035000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409716","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}