{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T08:03:20Z","timestamp":1742803400105,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409726","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T19:02:41Z","timestamp":1532977361000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Reliability analysis and electrical characterization of a Class-E resonant inverter"],"prefix":"10.1109","author":[{"given":"M.","family":"Catelani","sequence":"first","affiliation":[]},{"given":"L.","family":"Ciani","sequence":"additional","affiliation":[]},{"given":"A.","family":"Reatti","sequence":"additional","affiliation":[]},{"given":"F.","family":"Corti","sequence":"additional","affiliation":[]},{"given":"V.","family":"Sorrentino","sequence":"additional","affiliation":[]},{"given":"Agasthya","family":"Ayachit","sequence":"additional","affiliation":[]},{"given":"Marian K.","family":"Kazimierczuk","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EPECS.2013.6713092"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CIMCA.2016.8053297"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IC4.2015.7375644"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2420"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/QR2MSE.2013.6625547"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MetroAeroSpace.2017.7999577"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.egypro.2015.07.755"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488035"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1016\/j.ress.2017.03.001","article-title":"Validation, verification and evaluation of a Train to Train Distance Measurement System by means of Colored Petri Nets","volume":"164","author":"haifeng","year":"2017","journal-title":"Reliability Engineering & System Safety"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229533"},{"key":"ref4","article-title":"Mission profile based system-level reliability analysis of DC-DC converters for backup power applications","author":"zhou","year":"2017","journal-title":"IEEE Trans Power Electron"},{"key":"ref3","article-title":"Reliability analysis of wave energy converters","author":"muller","year":"2017","journal-title":"International Conference on Renewable Energy Reserch and Applications"},{"journal-title":"Military Handbook Reliability Prediction of Electronic Equipment","article-title":"U.S.A. Department of Defence, MIL-HDBK-217F","year":"1991","key":"ref6"},{"key":"ref5","article-title":"Reliability comparison of two industrial AC\/DC converters with resonant and nonresonant topologies","author":"valipour","year":"2015","journal-title":"Proceedings of 2015 IEEE International 6th Power Electronics Drive Systems and Technologies Conference Tehran"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S1665-6423(13)71519-0"},{"key":"ref7","article-title":"Experimental evaluations of capacitors for high power reonant converters","author":"vasic","year":"2017","journal-title":"Proc of PCIM Europe"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2017.00011"},{"key":"ref1","article-title":"Reliability metrics extraction for power converter stressed by thermal Ccyc1e","author":"ma","year":"2017","journal-title":"IEEE Energy Conversion Congress and Exposition Cincinnati"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2015.7356277"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2016.7793285"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409726.pdf?arnumber=8409726","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T19:31:34Z","timestamp":1534534294000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409726\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409726","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}