{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:18:26Z","timestamp":1730225906474,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409806","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T19:02:41Z","timestamp":1532977361000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Ultra high-Q 60GHz open resonator system for precision dielectric permittivity and loss tangent measurements"],"prefix":"10.1109","author":[{"given":"Wei","family":"Quan","sequence":"first","affiliation":[]},{"given":"M. N.","family":"Afsar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"1854","article-title":"An automated 60GHz open resonator system for precision dielectric measurement","volume":"39","author":"afsar","year":"1990","journal-title":"IEEE Trans on Microwave Theory Tech"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1974.4314330"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.892855"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.769673"},{"key":"ref7","article-title":"Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths","volume":"57","author":"chen","year":"2008","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/22.88556"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1971.0181"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409806.pdf?arnumber=8409806","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,17]],"date-time":"2018-08-17T19:32:24Z","timestamp":1534534344000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409806\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409806","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}