{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:18:41Z","timestamp":1730225921384,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/i2mtc.2018.8409857","type":"proceedings-article","created":{"date-parts":[[2018,7,30]],"date-time":"2018-07-30T15:02:41Z","timestamp":1532962961000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["VMD and HMM based rolling bearing fault diagnosis"],"prefix":"10.1109","author":[{"given":"Jinyuan","family":"Jiang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wang","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCSLP.2016.7918406"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IMCCC.2015.46"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/KCIC.2017.8228583"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICSensT.2016.7796267"},{"key":"ref14","first-page":"91","volume":"5","author":"wall","year":"2002","journal-title":"Singular value decomposition and principal component analysis"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/5.18626"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICACCS.2015.7324119"},{"key":"ref4","first-page":"1","article-title":"A novel fault diagnosis method for rolling bearing based on EEMD- PE and multi class relevance vector machine","author":"liu","year":"2017","journal-title":"2017 IEEE International Instrumentation and Measurement Technology Conference (12MTC)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1142\/9789812703347_0001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2288675"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSN.2016.7586634"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICIINFS.2014.7036515"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICSensT.2016.7796267"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2017.8079266"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2017.2720177"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ChiCC.2016.7554407"}],"event":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC )","start":{"date-parts":[[2018,5,14]]},"location":"Houston, TX, USA","end":{"date-parts":[[2018,5,17]]}},"container-title":["2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8401508\/8409512\/08409857.pdf?arnumber=8409857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,7,31]],"date-time":"2018-07-31T03:49:38Z","timestamp":1533008978000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8409857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2018.8409857","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}