{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:19:13Z","timestamp":1730225953904,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826846","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Image matching algorithm for weed control applications in organic farming"],"prefix":"10.1109","author":[{"given":"Stephan","family":"Hussmann","sequence":"first","affiliation":[]},{"given":"Yuheng","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Vitali","family":"Czymmek","sequence":"additional","affiliation":[]},{"given":"Florian J.","family":"Knoll","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"451","article-title":"Precision application of herbicides by use of optoelectronic sensors","author":"biller","year":"1997","journal-title":"Precision Agriculture 1997 1st European Conf on Precision Agriculture"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2014.6835733"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2018.08.032"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2005.1530427"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2001.937673"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2007.09.014"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151234"},{"journal-title":"Modern Graph Theory","year":"2013","author":"bollobas","key":"ref17"},{"key":"ref4","first-page":"49","article-title":"Current achievements and future directions of physical weed control in Europe","author":"melander","year":"2006","journal-title":"AFPP 3rd International conference on nonchemical crop protection methods Proceedings"},{"key":"ref3","first-page":"323","article-title":"Concept and virtual prototype of a rotary hoe for intra-row weed control in row crops","author":"gobor","year":"2006","journal-title":"World Congress Agricultural Engineering for a Better WorId Book of Abstracts"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-3180.2008.00629.x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-9277-9_17"},{"key":"ref8","first-page":"125","article-title":"Laser based weed control","author":"gude","year":"2010","journal-title":"Proc of the 68th International Conference Agricultural Engineering"},{"key":"ref7","article-title":"Analysis and Definition of the close-to-crop Area in Relation to Robotic Weeding","author":"n\u00f8rremark","year":"2004","journal-title":"6th Workshop of the EWRS Working Group 'Physical and Cultural Weed Control' Lillehammer"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520508"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SAI.2016.7556004"},{"key":"ref9","first-page":"537","article-title":"Optical dicrimination of crop, weed and soil for on-line weed detection","volume":"2","author":"vrindts","year":"1997","journal-title":"Precision Agriculture 1997 1st European Conf on Precision Agriculture"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826846.pdf?arnumber=8826846","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T15:19:34Z","timestamp":1658157574000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826846\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826846","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}