{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,7]],"date-time":"2025-08-07T20:49:39Z","timestamp":1754599779135},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826878","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["Thin-film Thickness Absolute Measurement by Differential Optic-fiber White Light Interferometry"],"prefix":"10.1109","author":[{"given":"Xu","family":"Lu","sequence":"first","affiliation":[]},{"given":"Zhangjun","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Jun","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Yonggui","family":"Yuan","sequence":"additional","affiliation":[]},{"given":"Hanyang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Libo","family":"Yuan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/AO.38.005968"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1117\/12.576056"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/AO.42.000550"},{"journal-title":"JCGM 100 2008 Evaluation of Measurement Data —Guide to the Expression of Uncertainty in Measurement (S èvres BIPM)","year":"0","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/AO.43.003028"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0040-6090(85)90273-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2003.12.100"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/OPEX.13.010066"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.002944"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2014.06.050"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/9509043"},{"key":"ref1","first-page":"836","article-title":"A Stylus Method for Evaluating the Thickness of Thin-films and Substrate Surface Roughness","author":"schwartz","year":"1961","journal-title":"Trans Eighth Vacuum Symp and Second Internat'l Cong"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OL.39.004172"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826878.pdf?arnumber=8826878","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:19:37Z","timestamp":1658261977000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826878\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826878","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}