{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T10:05:32Z","timestamp":1767261932854},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826892","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":14,"title":["Low Profile and Low Cost Textile Smart Mat for Step Pressure Sensing and Position Mapping"],"prefix":"10.1109","author":[{"given":"Erfeng","family":"Li","sequence":"first","affiliation":[]},{"given":"Xiaoyou","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Boon-Chong","family":"Seet","sequence":"additional","affiliation":[]},{"given":"Frances","family":"Joseph","sequence":"additional","affiliation":[]},{"given":"Jono","family":"Neville","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2016.7384959"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2017.8234157"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSP.2014.6950019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.2519\/jospt.2018.7459"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICABME.2017.8167539"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICORAS.2017.8308057"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201403532"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICORR.2009.5209539"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2509470"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/BSN.2018.8329646"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SpliTech.2016.7555935"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826892.pdf?arnumber=8826892","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:21:55Z","timestamp":1658262115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826892\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826892","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}