{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T04:11:35Z","timestamp":1725595895062},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826893","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["A camera-based system for highly accurate 3D displacement field measurement and contactless force sensing"],"prefix":"10.1109","author":[{"given":"Debbie","family":"Zhao","sequence":"first","affiliation":[]},{"given":"Amir","family":"HajiRassouliha","sequence":"additional","affiliation":[]},{"given":"Emily J. Lam Po","family":"Tang","sequence":"additional","affiliation":[]},{"given":"Martyn P.","family":"Nash","sequence":"additional","affiliation":[]},{"given":"M. F.","family":"Poul Nielsen","sequence":"additional","affiliation":[]},{"given":"Andrew J.","family":"Taberner","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-018-0419-y"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijadhadh.2018.02.019"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jbiomech.2014.01.054"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2370945"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/23\/5\/053001"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2018.06.073"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201305064"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2600671"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.echo.2017.05.018"},{"key":"ref19","article-title":"Subpixel phase-based image registration using Savitzky-Golay differentiators in gradient-correlation","author":"hajirassouliha","year":"2017","journal-title":"Computer Vision and Image Understanding"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/gamm.201800004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/1.2714926"},{"journal-title":"Crack-Tip Plastic Zone Size and Shape via DIC Proceedings of the 2018 Annual Conference on Experimental and Applied Mechanics","year":"2019","author":"gonzales","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2006.888527"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cscm.2018.e00182"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s12046-010-0039-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2017.09.052"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1111\/ext.12173"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.irbm.2015.02.002"},{"key":"ref20","article-title":"Subpixel measurement of living skin deformation using intrinsic features","author":"hajirassouliha","year":"2016","journal-title":"Proceedings of Computational Biomechanics for Medicine XI Workshop MICCAI"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-52280-7_2"},{"journal-title":"Robust and accurate multiple-camera stereographic calibration","year":"0","author":"hajirassouliha","key":"ref21"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826893.pdf?arnumber=8826893","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:19:37Z","timestamp":1658261977000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826893\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826893","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}