{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:34:41Z","timestamp":1729618481212,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826896","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["A Kalman Filter Approach for the Application of Electrical Capacitance Tomography in Dynamic Processes using a State Reduction"],"prefix":"10.1109","author":[{"given":"T.","family":"Suppan","sequence":"first","affiliation":[]},{"given":"M.","family":"Neumayer","sequence":"additional","affiliation":[]},{"given":"T.","family":"Bretterklieber","sequence":"additional","affiliation":[]},{"given":"S.","family":"Puttinger","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"667","article-title":"Volume fraction estimation in pneumatic conveying from tomographic measurements","volume":"3","author":"suppan","year":"2018","journal-title":"Proceedings of the 9th world congress on industrial process tomography"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/7.993234"},{"key":"ref12","first-page":"196","author":"watzenig","year":"2003","journal-title":"Managing Noisy Measurement Data by Means of Statistical Parameter Estimation in Electrical Capacitance Tomography"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1108\/03321640310474903"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"429","DOI":"10.1108\/SR-01-2016-0027","article-title":"A review on image reconstruction algorithms for electrical capacitance\/resistance tomography","volume":"36","author":"cui","year":"2016","journal-title":"Sensor Review"},{"key":"ref3","first-page":"65","author":"neumayer","year":"2011","journal-title":"Current Reconstruction Algorithms in Electrical Capacitance Tomography"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1115\/1.3662552"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/10.664204"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2001.931960"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/0470045345"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1007\/b138659","volume":"160","author":"kaipio","year":"2005","journal-title":"Statistical and Computational Inverse Problems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/8\/317"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1108\/COMPEL-02-2017-0090"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826896.pdf?arnumber=8826896","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,20]],"date-time":"2023-09-20T02:05:16Z","timestamp":1695175516000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826896\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826896","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}