{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:27:51Z","timestamp":1763724471861,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826908","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Jitter Measurement in Digital Signals by Using Software Defined Radio Technology"],"prefix":"10.1109","author":[{"given":"Gehan","family":"Anthonys","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael J.","family":"Cree","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lee","family":"Streeter","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/35.392998"},{"journal-title":"Wireless communication with a mobile asset employing dynamic configuration of a software defined radio","year":"2005","author":"davenport","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2182969"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1155\/WCN.2005.275"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/98.760422"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICSPCS.2018.8631708"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1504\/IJISTA.2008.021303"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCS.2007.4292693"},{"journal-title":"Introduction to Signal Processing","year":"1996","author":"orfanidis","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1958.tb03874.x"},{"key":"ref4","first-page":"6","article-title":"Jitter decomposition by time lag correlation","author":"dou","year":"2006","journal-title":"7th Inter Symp on Quality Electronic Design (ISQED’06)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805809"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.884.113"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCAS.2009.5250491"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/62.210638"},{"journal-title":"Software Defined Radio Origins Drivers and International Perspectives","year":"2002","author":"tuttlebee","key":"ref7"},{"key":"ref2","first-page":"44","article-title":"Jitter-understanding it, measuring it, eliminating it part 1: Jitter fundamentals","volume":"4","author":"hancock","year":"2004","journal-title":"High Frequency Electronics"},{"journal-title":"Jitter Noise and Signal Integrity at High-Speed","year":"2007","author":"li","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.19053\/01211129.3160"},{"journal-title":"Understanding Digital Signal Processing","year":"2011","author":"lyons","key":"ref20"},{"year":"0","key":"ref22"},{"journal-title":"Frequency Analysis","year":"1987","author":"randall","key":"ref21"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826908.pdf?arnumber=8826908","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T15:21:46Z","timestamp":1658157706000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826908\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826908","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}