{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:19:50Z","timestamp":1730225990444,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826935","type":"proceedings-article","created":{"date-parts":[[2019,9,9]],"date-time":"2019-09-09T21:14:51Z","timestamp":1568063691000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Defect Feature Extraction in Eddy Current Testing Based on Convolutional Sparse Coding"],"prefix":"10.1109","author":[{"given":"Yang","family":"Tao","sequence":"first","affiliation":[]},{"given":"Hanyang","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Jorge R. Salas","family":"Avila","sequence":"additional","affiliation":[]},{"given":"Christos","family":"Ktistis","sequence":"additional","affiliation":[]},{"given":"Wuliang","family":"Yin","sequence":"additional","affiliation":[]},{"given":"Anthony J.","family":"Peyton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1214\/009053607000000631"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/78.258082"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1137\/S1064827596304010"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"1045","DOI":"10.1109\/JPROC.2010.2040551","article-title":"Dictionaries for Sparse Representation Modeling","volume":"98","author":"rubinstein","year":"2010","journal-title":"Proceedings of the IEEE"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511794308"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.1999.760624"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2005.244"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.881199"},{"key":"ref19","article-title":"Working locally thinking globally-part I: Theoretical guarantees for convolutional sparse coding","author":"papyan","year":"2016","journal-title":"arXiv preprint arXiv 1607 02005"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.pnucene.2007.07.008"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2676460"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2011.01.009"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.892515"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2011.12.001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2013.2295311"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2792848"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2514778"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7011-4"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2004.06.001"},{"key":"ref20","article-title":"Optimization methods for convolutional sparse coding","author":"bristow","year":"2014","journal-title":"arXiv preprint arXiv 1406 2407"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSIPN.2016.2605763"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0024-3795(94)90486-3"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2015.2393637"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1137\/100806278"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520511"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826935.pdf?arnumber=8826935","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T16:22:44Z","timestamp":1658247764000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826935\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826935","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}