{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:35:03Z","timestamp":1725780903756},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826936","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":5,"title":["Wireline channel estimation by compressive sampling for physical layer testing"],"prefix":"10.1109","author":[{"given":"Luca","family":"De Vito","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"Picariello","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergio","family":"Rapuano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ioan","family":"Tudosa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lee","family":"Barford","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2042415"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.11.015"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2007.909108"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/WCNC.2015.7127542"},{"key":"ref11","article-title":"An improved and simple cable simulation model","author":"hyland","year":"2012","journal-title":"Maxim integrated Appication note APP 5141"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2010.5621984"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2017.2704105"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2007.906657"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2017.7864545"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2009.2038424"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914731"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826936.pdf?arnumber=8826936","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:22:44Z","timestamp":1658262164000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826936\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826936","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}