{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T14:10:01Z","timestamp":1773843001779,"version":"3.50.1"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8826962","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":20,"title":["\u201cPaper\u201dBased Sensor for Deformation Measurements"],"prefix":"10.1109","author":[{"given":"Giovanna Di","family":"Pasquale","sequence":"first","affiliation":[]},{"given":"Salvatore","family":"Graziani","sequence":"additional","affiliation":[]},{"given":"Antonino","family":"Pollicino","sequence":"additional","affiliation":[]},{"given":"Carlo","family":"Trigona","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2010.04.009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/10\/4\/327"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2118870"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2026613"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/14\/1\/020"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/srep06913"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.06.071"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.04.015"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesa.2015.11.007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.12.015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2004.03.043"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/mi9010019"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/17\/01\/015009"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.carbpol.2018.08.054"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1039\/c3ta13517a"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/19\/1\/015003"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108077"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/22\/1\/015017"},{"key":"ref8","author":"la rosa","year":"2010","journal-title":"Printed Organic Electronics From Materials to Circuits in Nanoelectronics Nanowires Molecular Electronics and Nanodevices"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.mseb.2008.06.009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2038297"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2538060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1039\/c3cs60235d"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2005.09.006"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.08.009"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2019321"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2010.02.046"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b04927"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/22\/8\/085026"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.aaspro.2014.11.017"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Auckland, New Zealand","start":{"date-parts":[[2019,5,20]]},"end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08826962.pdf?arnumber=8826962","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:21:54Z","timestamp":1658262114000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8826962\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8826962","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}