{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:31:54Z","timestamp":1764174714070,"version":"build-2065373602"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8827035","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["An FPGA-based Time Sampling Charge Measurement Method for TOF-PET Detectors"],"prefix":"10.1109","author":[{"given":"Bo","family":"Wu","sequence":"first","affiliation":[]},{"given":"Yonggang","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Qiang","family":"Cao","sequence":"additional","affiliation":[]},{"given":"Jie","family":"Kuang","sequence":"additional","affiliation":[]},{"given":"Mingchen","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xiaoyu","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/23.603658"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/11\/03\/C03042"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2746626"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2293758"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/RTC.2016.7543079"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2421319"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2009.01.100"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2011.10.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejmp.2015.12.007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2277855"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.2174\/138920110792246555"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08827035.pdf?arnumber=8827035","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T14:45:23Z","timestamp":1658155523000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8827035\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8827035","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}