{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:20:26Z","timestamp":1730226026098,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8827082","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Evaluation of Voltage-driven Electrical Resistance Tomography Using LCR Meter-based Measurement System"],"prefix":"10.1109","author":[{"given":"Chao","family":"Wang","sequence":"first","affiliation":[]},{"given":"Qingqing","family":"Cao","sequence":"additional","affiliation":[]},{"given":"Ziqiang","family":"Cui","sequence":"additional","affiliation":[]},{"given":"Yuxiang","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Huaxiang","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2280483"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2084770"},{"key":"ref12","first-page":"3","article-title":"Electrical resistance tomography for process applications","volume":"247","author":"fraser","year":"1996","journal-title":"Meas Scien and Techn"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S1004-9541(12)60400-5"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/22\/5\/055503"},{"key":"ref15","first-page":"156","article-title":"A vector derivation useful in impedance plethysmographic field calculations","volume":"2","author":"john","year":"1972","journal-title":"IEEE Transactions on Biomedical Engineering"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/10\/11\/315"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2011.5944121"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2010.02.005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2007.08.057"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2010.02.006"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1404","DOI":"10.1109\/TMI.2008.920600","article-title":"Electrical impedance tomography problem with inaccurately known boundary and contact impedances","volume":"27","author":"ville","year":"2008","journal-title":"IEEE Transactions on Medical Imaging"},{"key":"ref8","first-page":"6","article-title":"Design of Twin-Plane Electrical Resistance Tomography System","volume":"2","author":"cui","year":"2010","journal-title":"Journal of Tianjin University"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2009.12.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2015.08.010"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.877751"},{"key":"ref9","article-title":"Electrical resistance tomography with voltage excitation","author":"rodriguez","year":"2016","journal-title":"Instrumentation and Measurement Technology Conference Proceedings (I2MTC) 2016 IEEE International"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08827082.pdf?arnumber=8827082","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:21:55Z","timestamp":1658262115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8827082\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8827082","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}