{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T16:50:51Z","timestamp":1774630251293,"version":"3.50.1"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8827096","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["Measurement of CFRP surface crack based on electromagnetic measuring system"],"prefix":"10.1109","author":[{"given":"Qian","family":"Zhao","sequence":"first","affiliation":[]},{"given":"Kai","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Hanyang","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Jorge Ricardo Salas","family":"Avila","sequence":"additional","affiliation":[]},{"given":"Lina","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Mingquan","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Yan","family":"Han","sequence":"additional","affiliation":[]},{"given":"Zhijie","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Wuliang","family":"Yin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0266-3538(00)00178-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1135889"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0266-3538(00)00164-0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894183"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.05.006"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351849"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IST.2017.8261512"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2600918"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2479106"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.01.007"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1177\/0731684415618458"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2012.08.016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/BF00115908"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/10589759908952865"},{"key":"ref8","author":"bhargava","year":"2004","journal-title":"Engineering materials polymers ceramics and composites"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1163\/1568551042580226"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesb.2016.11.018"},{"key":"ref1","article-title":"Eddy current techniques for non-destructive testing of carbon fibre reinforced plastic (CFRP)","author":"li","year":"2012","journal-title":"University of Manchester"},{"key":"ref9","first-page":"1581","article-title":"Single-sided eddy current method to measure electrical resistivity","volume":"46","author":"vernon","year":"1988","journal-title":"material Evaluation"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2728338"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Auckland, New Zealand","start":{"date-parts":[[2019,5,20]]},"end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08827096.pdf?arnumber=8827096","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:19:37Z","timestamp":1658261977000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8827096\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8827096","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}