{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:31:30Z","timestamp":1725784290192},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/i2mtc.2019.8827125","type":"proceedings-article","created":{"date-parts":[[2019,9,10]],"date-time":"2019-09-10T01:14:51Z","timestamp":1568078091000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["A Hall Effect Based Through Shaft Angle Sensor - Analysis and Signal Conditioning"],"prefix":"10.1109","author":[{"given":"Rahul","family":"Kumar","sequence":"first","affiliation":[]},{"given":"British Ashok","family":"Sontakke","sequence":"additional","affiliation":[]},{"given":"C.S.","family":"Anoop","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSensT.2012.6461720"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2302243"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2013.6555636"},{"year":"2018","key":"ref13"},{"article-title":"Sensors and Signal Conditioning","year":"0","author":"areny","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2588981"},{"year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2794822"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2011.6073541"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2008.2011086"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(01)00621-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IMCCC.2016.115"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2874065"}],"event":{"name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2019,5,20]]},"location":"Auckland, New Zealand","end":{"date-parts":[[2019,5,23]]}},"container-title":["2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8822388\/8826808\/08827125.pdf?arnumber=8827125","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:21:55Z","timestamp":1658262115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8827125\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2019.8827125","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}