{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T15:31:13Z","timestamp":1773329473857,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9128414","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T17:17:34Z","timestamp":1593537454000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Accelerated Degradation Wiener Model for Lithiumion Battery Considering Individual Difference"],"prefix":"10.1109","author":[{"given":"Yandong","family":"Hou","sequence":"first","affiliation":[]},{"given":"Datong","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Yu","family":"Peng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.08.004"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.10.027"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2016.04.014"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"545","DOI":"10.1080\/00949655.2012.719026","article-title":"Residual life estimation based on bivariate Wiener degradation process with time-scale transformations","volume":"84","author":"xiaolin","year":"2014","journal-title":"J Statistical Computation & Simulation"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-010-2532-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2182221"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.03.028"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2008.06.017"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1998.10485191"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.02.005"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-005-5237-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.085"},{"key":"ref7","first-page":"464","article-title":"A novel method for determing the lifetime of devices based on process-stress accelerated degradation test","author":"guo","year":"2009","journal-title":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.06.045"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/en11061420"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/560726"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Dubrovnik, Croatia","start":{"date-parts":[[2020,5,25]]},"end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09128414.pdf?arnumber=9128414","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T12:03:06Z","timestamp":1656331386000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128414\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9128414","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}