{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:09:45Z","timestamp":1730225385398,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9128445","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:17:34Z","timestamp":1593551854000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Assessment of pressure vessel based on Variational Bayesian"],"prefix":"10.1109","author":[{"given":"Haonan","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Chun","family":"Yin","sequence":"additional","affiliation":[]},{"given":"Yuhua","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Xuegang","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Kai","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Anhua","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Xuan","family":"Gou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2017.11.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.282"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2018.08.037"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.12.087"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1016\/j.eswa.2018.07.039","article-title":"Nested cross-validation based adaptive sparse representation algorithm and its application to pathological brain classification[J]","volume":"114","author":"lingraj","year":"2018","journal-title":"Expert Systems with Applications"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.02.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2801809"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2492925"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177729694"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/34.400568"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-21099-0_10"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2010.52.2.87"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.matdes.2019.108323"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2930114"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12652-017-0671-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2968398"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.msea.2018.04.008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.prostr.2016.06.075"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.02.043"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/34.1000236"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2197748"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2020,5,25]]},"location":"Dubrovnik, Croatia","end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09128445.pdf?arnumber=9128445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:54:49Z","timestamp":1656345289000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9128445","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}