{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T14:13:42Z","timestamp":1777472022810,"version":"3.51.4"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9128489","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:17:34Z","timestamp":1593551854000},"page":"1-6","source":"Crossref","is-referenced-by-count":15,"title":["Detecting Defects in Photovoltaic Cells and Panels With the Help of Time-Resolved Thermography Under Outdoor Environmental Conditions"],"prefix":"10.1109","author":[{"given":"Christian","family":"Schuss","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kari","family":"Remes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kimmo","family":"Leppanen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juha","family":"Saarela","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tapio","family":"Fabritius","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bernd","family":"Eichberger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timo","family":"Rahkonen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2199196"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2013.6555407"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2016.04.079"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2011.05.049"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2012.07.019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/pip.2716"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2508287"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2809078"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2019.08.061"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/pip.3175"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.egypro.2014.06.067"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2010.12.018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/pip.2866"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IESC.2018.8439986"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2017.09.101"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2016.09.072"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosust.2012.01.004"},{"key":"ref1","year":"0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2013862"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/EEEIC.2019.8783525"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520345"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Dubrovnik, Croatia","start":{"date-parts":[[2020,5,25]]},"end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09128489.pdf?arnumber=9128489","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T16:00:11Z","timestamp":1656345611000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128489\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9128489","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}