{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:10:35Z","timestamp":1730225435727,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9128651","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:17:34Z","timestamp":1593551854000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Comparison of the VLP-16 LiDAR system with an absolute interferometer"],"prefix":"10.1109","author":[{"given":"Stefano","family":"Cattini","sequence":"first","affiliation":[]},{"given":"Luigi","family":"Rovati","sequence":"additional","affiliation":[]},{"given":"Luca","family":"Di Cecilia","sequence":"additional","affiliation":[]},{"given":"Luca","family":"Ferrari","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CYBER.2018.8688235"},{"article-title":"An overview of activities at NIST towards the proposed ASTM E57 3D imaging system point-to-point distance standard","year":"0","author":"rachakonda","key":"ref11"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"28 099","DOI":"10.3390\/s151128099","article-title":"A Review of LIDAR Radiometric Processing: From Ad Hoc Intensity Correction to Rigorous Radiometric Calibration","volume":"15","author":"kashani","year":"2015","journal-title":"SENSORS"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1051\/metrology\/20150013003"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/12.2021037"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s110909069"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/2051-672X\/3\/1\/015006"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2014.11.002"},{"year":"2012","key":"ref18","article-title":"Evaluation of measurement data — The role of measurement uncertainty in conformity assessment"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1177\/0278364911435689"},{"key":"ref4","article-title":"A 66db linear dynamic range, 100 dB? transimpedance gain TIA with High Speed PDSH for LiDAR","author":"ma","year":"2019","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2879705"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2931526"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2640518"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2840598"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2918372"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2906416"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MCE.2016.2556878"},{"key":"ref9","doi-asserted-by":"crossref","DOI":"10.3390\/photonics5020012","article-title":"Range information characterization of the hokuyo UST-20LX LIDAR sensor","volume":"5","author":"cooper","year":"2018","journal-title":"Photonics"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2020,5,25]]},"location":"Dubrovnik, Croatia","end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09128651.pdf?arnumber=9128651","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T16:03:06Z","timestamp":1656345786000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128651\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9128651","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}