{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T14:51:21Z","timestamp":1784904681418,"version":"3.55.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9128856","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T17:17:34Z","timestamp":1593537454000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Logic Built-In Self-Test Instrumentation System for Engineering Test Technology Education"],"prefix":"10.1109","author":[{"given":"S.","family":"Demidenko","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M. T.","family":"Chew","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"B. T.","family":"Nguyen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M. P.-L.","family":"Ooi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Y. C.","family":"Kuang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Programmable Logic Device (PLD) Market Segmentation","year":"2019","journal-title":"Rep-ID- 700 Research Nester"},{"key":"ref11","article-title":"ATF16V8B, ATF16V8BQ*, and ATF16V8BQL. High-performance EE PLD","year":"0","journal-title":"ATMEL"},{"key":"ref12","article-title":"WinCUPL","year":"0","journal-title":"Microchip"},{"key":"ref13","article-title":"Programmable Logic Device Design Software","year":"0","journal-title":"ATMEL"},{"key":"ref14","author":"stroud","year":"2002","journal-title":"A Designer's Guide to Built-In Self-Test"},{"key":"ref15","article-title":"High Performance EE PLD ATF22V10C","year":"0","journal-title":"ATMEL"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CIVEMSA.2017.7995320"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827016"},{"key":"ref6","article-title":"What Is LabVIEW?","year":"0","journal-title":"National Instruments"},{"key":"ref5","article-title":"NI ELVIS","year":"0","journal-title":"National Instruments"},{"key":"ref8","author":"yarmolik","year":"1988","journal-title":"Generation and Application of Pseudorandom Sequences for Random Testing"},{"key":"ref7","article-title":"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits","author":"bushnell","year":"2013"},{"key":"ref2","first-page":"24.1298.1","article-title":"University-Industry Partnership in Semiconductor Engineering","author":"dallas","year":"2014","journal-title":"121st ASEE Annual Conf & Exposition American Society for Engineering Education"},{"key":"ref1","article-title":"International Technology Roadmap for Semiconductors","year":"2015","journal-title":"Test and Test Equipment"},{"key":"ref9","author":"grout","year":"2006","journal-title":"Integrated Circuit Test Engineering Modern Techniques"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Dubrovnik, Croatia","start":{"date-parts":[[2020,5,25]]},"end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09128856.pdf?arnumber=9128856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T12:00:22Z","timestamp":1656331222000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9128856","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}