{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:20:12Z","timestamp":1725585612520},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9129113","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T17:17:34Z","timestamp":1593537454000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Linearity Testing of Cascaded Analog Mixed-Signal Blocks Using SEIR Method"],"prefix":"10.1109","author":[{"given":"Tatsuya","family":"Ishikawa","sequence":"first","affiliation":[]},{"given":"Chia-Wei","family":"Pai","sequence":"additional","affiliation":[]},{"given":"Hiroki","family":"Ishikuro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409605"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8623991"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2436875"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469548"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2167272"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2769238"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8777944"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2902023"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.293454"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATC.2018.8587468"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2020,5,25]]},"location":"Dubrovnik, Croatia","end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09129113.pdf?arnumber=9129113","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T20:21:11Z","timestamp":1656361271000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129113\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9129113","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}