{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:11:22Z","timestamp":1730225482149,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/EU.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9129170","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:17:34Z","timestamp":1593551854000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Integrated Silicon Nitride Horizontal Long Period Grating for Refractometric Gas Sensing applications"],"prefix":"10.1109","author":[{"given":"Clement","family":"Deleau","sequence":"first","affiliation":[]},{"given":"Han-Cheng","family":"Seat","sequence":"additional","affiliation":[]},{"given":"Helene","family":"Tap","sequence":"additional","affiliation":[]},{"given":"Frederic","family":"Surre","sequence":"additional","affiliation":[]},{"given":"Olivier","family":"Bernal","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"first-page":"295","year":"2006","author":"estrudillo-ayala","key":"ref10"},{"journal-title":"Optical Waveguide Theory","year":"1983","author":"snyder","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.16.001312"},{"key":"ref13","article-title":"Coupled local-mode theory for strongly modulated long period gratings","volume":"28","author":"jin","year":"2010","journal-title":"Journal of Lightwave Technology"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2006.08.003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/OE.23.031564"},{"key":"ref16","article-title":"Study, analysis and experimental validation of fiber refractometers based on single-mode, multimode and photonic crystal fibers for refractive index measurements with application for the detection of methane","author":"apriyanto","year":"2019","journal-title":"HAL Archives ouvertes"},{"journal-title":"Kb lumerical com","year":"0","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.013875"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/721035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2010.04.007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/50.476137"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s131014055"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1039\/b806129g"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2003.810257"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.008012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s90604559"},{"article-title":"Long-period grating devices for application in optical communication","year":"2006","author":"chiang","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2009.2028313"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.14.001760"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.14.003007"},{"key":"ref21","article-title":"Sensitivity to pressure and methane of a cryptophane-A doped polymer","author":"ingvaldsen","year":"2015","journal-title":"SemanticScholar"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2020,5,25]]},"location":"Dubrovnik, Croatia","end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09129170.pdf?arnumber=9129170","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T00:18:59Z","timestamp":1656375539000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129170\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9129170","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}