{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,25]],"date-time":"2026-01-25T14:07:03Z","timestamp":1769350023326,"version":"3.49.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9129483","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:17:34Z","timestamp":1593551854000},"page":"1-6","source":"Crossref","is-referenced-by-count":10,"title":["A Feature Transferring Fault Diagnosis based on WPDR, FSWT and GoogLeNet"],"prefix":"10.1109","author":[{"given":"Guannan","family":"Cao","sequence":"first","affiliation":[]},{"given":"Kaifeng","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Kaibo","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Hao","family":"Pan","sequence":"additional","affiliation":[]},{"given":"Yanhe","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Jie","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2605629"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-018-3579-x"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2018.04.009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.05.098"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-015-1153-2"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.03.014"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2519325"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2009.01.008"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2009.07.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruc.2010.07.011"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.knosys.2017.10.024","article-title":"Intelligent fault diagnosis of rolling bearing using deep wavelet auto-encoder with extreme learning machine","volume":"140","author":"shao","year":"2018","journal-title":"Knowledge-Based Systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.09.026"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2015.03.014"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.02.016"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.05.050"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruc.2010.07.011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912763"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaaca6"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.08.002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2774777"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.03.017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.07.054"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2674738"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.11.014"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Dubrovnik, Croatia","start":{"date-parts":[[2020,5,25]]},"end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09129483.pdf?arnumber=9129483","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T00:22:08Z","timestamp":1656375728000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129483\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9129483","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}