{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:11:49Z","timestamp":1730225509155,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/i2mtc43012.2020.9129511","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:17:34Z","timestamp":1593551854000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Regularization Parameter considering Electric Field Attenuation for Electrical Resistance Tomography"],"prefix":"10.1109","author":[{"given":"Sitong","family":"Chen","sequence":"first","affiliation":[]},{"given":"Yanbin","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Feng","family":"Dong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1137\/1034115"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/42.700740"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2016.05.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1137\/0914086"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.1971.4502787"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/11\/114002"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2012.04.011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11517-013-1054-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-0427(00)00414-3"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"2731","DOI":"10.1118\/1.1995712","article-title":"Electrical impedance tomography: methods, history and applications","volume":"32","author":"david","year":"2005","journal-title":"Medical Physics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2014.01.008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/005"}],"event":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2020,5,25]]},"location":"Dubrovnik, Croatia","end":{"date-parts":[[2020,5,28]]}},"container-title":["2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9123988\/9128363\/09129511.pdf?arnumber=9129511","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T00:18:59Z","timestamp":1656375539000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129511\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/i2mtc43012.2020.9129511","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}