{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:18:55Z","timestamp":1740100735955,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100011047","name":"AGE-WELL","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100011047","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806503","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Network Effects on Dual Machine Learning Models Predicting Smart Home Sensor Measurements"],"prefix":"10.1109","author":[{"given":"Saif","family":"Almhairat","sequence":"first","affiliation":[{"name":"Carleton University,Department of Systems and Computer Engineering (SCE),Ottawa,Canada"}]},{"given":"Bruce","family":"Wallace","sequence":"additional","affiliation":[{"name":"Carleton University,Bruyère Research Institute; AGE-WELL SAM3 Innovation Hub,Department of SCE,Ottawa,Canada"}]},{"given":"Julien","family":"Lariviere-Chartier","sequence":"additional","affiliation":[{"name":"Carleton University,Bruyère Research Institute,Department of SCE,Ottawa,Canada"}]},{"given":"Ali","family":"El-Haraki","sequence":"additional","affiliation":[{"name":"TELUS Communications,Managing Consultant Cyber Security Strategy,Ottawa,Canada"}]},{"given":"Rafik","family":"Goubran","sequence":"additional","affiliation":[{"name":"Carleton University,Bruyère Research Institute; AGE-WELL SAM3 Innovation Hub,Department of SCE,Ottawa,Canada"}]},{"given":"Frank","family":"Knoefel","sequence":"additional","affiliation":[{"name":"Carleton University,AGE-WELL SAM3 Innovation Hub,Bruyère Research Institute; Elisabeth Bruyère Hospital; Department of SCE,Ottawa,Canada"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DASC-PICom-DataCom-CyberSciTec.2017.126"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MeMeA52024.2021.9478744"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISPCC.2012.6224376"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CNSM.2015.7367373"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICGHIT.2019.00009"},{"year":"0","key":"ref15","article-title":"tc-netem(8) - Linux manual page"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1974.1092259"},{"key":"ref17","article-title":"Autoregression Models for Time Series Forecasting With Python","author":"brownlee","year":"2017","journal-title":"Machine Learning Mastery"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.2011.6134080"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMTIC.2018.8467234"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IWMN.2019.8804998"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409727"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409885"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2019.8706128"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2948888"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jalz.2018.06.2485"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1177\/0020872815574130"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9460010"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2022,5,16]]},"location":"Ottawa, ON, Canada","end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806503.pdf?arnumber=9806503","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:18:18Z","timestamp":1658780298000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806503\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806503","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}