{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:12:19Z","timestamp":1730225539019,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806511","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Pulsed-Active Microwave Thermography"],"prefix":"10.1109","author":[{"given":"Logan M.","family":"Wilcox","sequence":"first","affiliation":[{"name":"Missouri University of Science and Technology,Microwave Sensing (μSense) Laboratory,Department of Electrical and Computer Engineering,Rolla,Missouri,USA"}]},{"given":"Mathias","family":"Bonmarin","sequence":"additional","affiliation":[{"name":"Zurich University of Applied Sciences,Institute of Computational Physics,Winterthur,Switzerland"}]},{"given":"Kristen M.","family":"Donnell","sequence":"additional","affiliation":[{"name":"Missouri University of Science and Technology,Microwave Sensing (μSense) Laboratory,Department of Electrical and Computer Engineering,Rolla,Missouri,USA"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"348","DOI":"10.1016\/j.infrared.2010.06.002","article-title":"Research on thermal wave processing of lock-in thermography based on analyzing image sequences for NDT","volume":"53","author":"junyan","year":"2010","journal-title":"Infrared Physics and Technology"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/09349840802366617"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1021\/je00058a001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1201\/9781315380476"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1115\/1.1311272"},{"key":"ref15","first-page":"7","article-title":"Thermographic inspection of composite materials","volume":"12","author":"srinivas","year":"2006","journal-title":"Proc National Seminar on Non-Destructive Evaluation"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSE.2010.5547297"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.03.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3003394"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa825a"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3060596"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2596080"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2013.03.008"},{"article-title":"Theory and Practice of Infrared Technology for Nondestructive Testing","year":"2001","author":"maldague","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9129215"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2022,5,16]]},"location":"Ottawa, ON, Canada","end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806511.pdf?arnumber=9806511","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:17:29Z","timestamp":1658780249000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806511\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806511","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}