{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,30]],"date-time":"2026-05-30T00:41:27Z","timestamp":1780101687626,"version":"3.54.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806617","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Enhanced IpD2FT-based Synchrophasor Estimation through Narrowband Interferers Compensation"],"prefix":"10.1109","author":[{"given":"Xuansheng","family":"Shan","sequence":"first","affiliation":[{"name":"Hunan University,College of Electrical and Information Engineering,Changsha,P.R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Macii","sequence":"additional","affiliation":[{"name":"University of Trento,Dep. of Industrial Engineering,Trento,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dario","family":"Petri","sequence":"additional","affiliation":[{"name":"University of Trento,Dep. of Industrial Engineering,Trento,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"He","family":"Wen","sequence":"additional","affiliation":[{"name":"Hunan University,College of Electrical and Information Engineering,Changsha,P.R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2308996"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2469433"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/s18092748"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2809080"},{"key":"ref14","first-page":"1","year":"2018","journal-title":"IEEE\/IEC International standard - Measuring Relays and Protection Equipment - Part 118-1 Synchrophasor for Power Systems - Measurements"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2020.2974174"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/29.32276"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/0165-1684(94)00123-H"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1985.1164557"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2852940"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.10837"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1974.1055282"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2779378"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2682098"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2324191"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.904546"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/app11052261"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/app11052318"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775458"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2594023"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Ottawa, ON, Canada","start":{"date-parts":[[2022,5,16]]},"end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806617.pdf?arnumber=9806617","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:16:54Z","timestamp":1658780214000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806617\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806617","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}