{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T04:43:28Z","timestamp":1725597808507},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806660","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Measurement Procedure to Investigate Ageing of Low-Power Voltage Transformers"],"prefix":"10.1109","author":[{"given":"Alessandro","family":"Mingotti","sequence":"first","affiliation":[{"name":"University of Bologna,Department of Electric, Electronic and Information Engineering,Bologna,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lorenzo","family":"Peretto","sequence":"additional","affiliation":[{"name":"University of Bologna,Department of Electric, Electronic and Information Engineering,Bologna,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roberto","family":"Tinarelli","sequence":"additional","affiliation":[{"name":"University of Bologna,Department of Electric, Electronic and Information Engineering,Bologna,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3233\/JAE-2010-1110"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1201\/b12275-18"},{"journal-title":"International Organization for Standardization Geneva Switzerland","article-title":"Instrument transformers - Part 1: General requirements","year":"2010","key":"ref12"},{"journal-title":"Instrument Transformers International Standardization Organization Geneva Switzerland","article-title":"Part 6: Additional general requirements for low-power instrument transformers","year":"2016","key":"ref13"},{"journal-title":"Instrument Transformers In-ternational Standardization Organization Geneva Switzerland","article-title":"Part 10: Additional requirements for low-power passive current transformers","year":"2018","key":"ref14"},{"journal-title":"International Organization for Standardization Geneva Switzerland","article-title":"Instrument transformers - Part 11: Additional requirements for low-power passive voltage transformers","year":"2018","key":"ref15"},{"key":"ref16","first-page":"1895","article-title":"Experimental study on operational reliability of a kind of all fiber-optic current transformer","author":"liu","year":"2014","journal-title":"POWERCON 2014 - 2014 International Conference on Power System Technology Towards Green Efficient and Smart Power System Proceedings"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2930007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9128777"},{"key":"ref19","article-title":"Experiences with measurement and analysis of the dielectric response of instrument transformers","author":"koch","year":"2019","journal-title":"ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2659858"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1051\/matecconf\/201819401035"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3021673"},{"key":"ref8","first-page":"1","article-title":"Effect of temperatusre on the accuracy of inductive current transformers","author":"mingotti","year":"2018","journal-title":"I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference Discovering New Horizons in Instrumentation and Measurement Proceedings"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s20205810"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/AMPS.2011.6090433"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2725381"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s19204472"},{"key":"ref20","article-title":"Condition assessment of instrument transformers using dielectric response analysis","author":"raetzke","year":"2012","journal-title":"International Conference on Large High Voltage Electric Systems"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ELINSL.2008.4570375"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2022,5,16]]},"location":"Ottawa, ON, Canada","end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806660.pdf?arnumber=9806660","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:17:51Z","timestamp":1658780271000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806660\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806660","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}